From Proc. IEEE North Atlantic Test Workshop, May 2004 Built-In Self-Test Configurations for Atmel FPGAs Using Macro Generation Language
نویسندگان
چکیده
The development and automatic generation of Built-In Self-Test (BIST) configurations for Atmel AT40K series Field Programmable Gate Arrays (FPGAs) are described. These BIST configurations completely test the programmable logic and routing resources in the core of the FPGA along with the dedicated Random Access Memories (RAMs) dispersed within the array. The BIST configurations are generated using Atmel’s Macro Generation Language (MGL) for any size FPGA. The advantages and limitations of this approach are discussed.
منابع مشابه
Built-In Self-Test Configurations for Atmel FPGAs Using Macro Generation Language
The development and automatic generation of Built-In Self-Test (BIST) configurations for Atmel AT40K series Field Programmable Gate Arrays (FPGAs) are described. These BIST configurations completely test the programmable logic and routing resources in the core of the FPGA along with the dedicated Random Access Memories (RAMs) dispersed within the array. The BIST configurations are generated usi...
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